STUDY OF THE PARAMETERS OF TIP-SAMPLE INTERACTIONS IN SHEAR MODE USING A QUARTZ TUNING FORK AFM WITH CONTROLLABLE Q-FACTOR

A quartz tuning fork-based atomic force microscopy for investigating the tip<197>sample interactions at the nanoscale in the shear-force mode is described. Results of force interactions (damping and elastic forces) can be obtained from the amplitude-phase-distance spectroscopy measurements made with a tuning fork with a tungsten tip and a sample surface. The influence of the interaction between tip and sample using the quality factor as an indicator is investigated. Furthermore, a simple model shows that the extension of a tuning fork-based AFM can be applied to quantitative analysis of the properties of the sample surface.
Автор:  Vo Thanh Tung, S. A. Chizhik, Tran Xuan Hoai
Стр:  141