MODEL OF MOTION OF THE PROBE OF AN ATOMIC-FORCE MICROSCOPE IN THE SEMICONTACT REGIME
S. O. Abetkovskaya and S. A. Chizhik UDC 539.3 The equation of motion of the oscillating probe of an atomic-force microscope in the field of surface forces of an elastic sample was numerically solved. The influence of the position of the probe and the elastic modulus of the sample on the dynamic parameters of the probe motion and the characteristics of the contact deformation of the sample was estimated. A. V. Luikov Heat and Mass Transfer Institute, National Academy of Sciences of Belarus, 15 P. Brovka Str., Minsk, 220072, Belarus. Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 80, No. 2, pp. 173-179, March-April, 2007. Original article submitted October 5, 2006.